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Title: Direct observation of fine structure in ion tracks in amorphous Si3N4 by TEM
Authors: Nakajima, K. kyouindb researcher_resolver
Morita, Y.
Suzuki, M. kyouindb researcher_resolver
Narumi, K.
Saitoh, Y.
Ishikawa, N.
Hojou, K.
Tsujimoto, M.
Isoda, S. kyouindb researcher_resolver
Kimura, K. kyouindb researcher_resolver
Author's alias: 木村, 健二
Keywords: C60
Ion track
Ion track
Issue Date: Nov-2012
Publisher: Elsevier B.V
Journal title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume: 291
Start page: 12
End page: 16
Abstract: Thin films of amorphous Si3N4 (thickness 20 nm) were irradiated with 120–720 keV C60+, 2+ ions and observed using transmission electron microscopy (TEM). The ion track produced in an amorphous material was directly observed by TEM. For quantitative analysis, the ion tracks were also observed using high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM). The observed ion track consists of a low density core (radius ∼2.5 nm) and a high density shell (width ∼2.5 nm), which is very similar to the ion tracks in amorphous SiO2 irradiated with high energy heavy ions observed by small angle X-ray scattering (SAXS). Although the observed ion tracks may be affected by surface effects, the present result indicates that TEM and HAADF-STEM have potential to observe directly the fine structures of ion tracks in amorphous materials.
Rights: © 2012 Elsevier B.V.
この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。This is not the published version. Please cite only the published version.
URI: http://hdl.handle.net/2433/162897
DOI(Published Version): 10.1016/j.nimb.2012.09.007
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