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1.4896881.pdf | 2.73 MB | Adobe PDF | 見る/開く |
タイトル: | Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media |
著者: | Umeda, Ken-ichi Kobayashi, Kei https://orcid.org/0000-0002-1409-6539 (unconfirmed) Oyabu, Noriaki Hirata, Yoshiki Matsushige, Kazumi Yamada, Hirofumi |
著者名の別形: | 山田, 啓文 |
発行日: | 7-Oct-2014 |
出版者: | American Institute of Physics Inc. |
誌名: | Journal of Applied Physics |
巻: | 116 |
号: | 13 |
論文番号: | 134307 |
抄録: | The distributions of surface charges or surface potentials on biological molecules and electrodes are directly related to various biological functions and ionic adsorptions, respectively. Electrostatic force microscopy and Kelvin-probe force microscopy (KFM) are useful scanning probe techniques that can map local surface charges and potentials. Here, we report the measurement and analysis of the electrostatic and capacitive forces on the cantilever tip induced by application of an alternating voltage in order to discuss the feasibility of measuring the surface charge or potential distribution at solid/liquid interfaces in various liquid media. The results presented here suggest that a nanometer-scale surface charge or potential measurement by the conventional voltage modulation techniques is only possible under ambient conditions and in a non-polar medium and is difficult in an aqueous solution. Practically, the electrostatic force versus dc voltage curve in water does not include the minimum, which is used for the surface potential compensation. This is because the cantilever oscillation induced by the electrostatic force acting on the tip apex is overwhelmed by the parasitic oscillation induced by the electrostatic force acting on the entire cantilever as well as the surface stress effect. We both experimentally and theoretically discuss the factors which cause difficulties in application of the voltage modulation techniques in the aqueous solutions and present some criteria for local surface charge and potential measurements by circumventing these problems. |
著作権等: | Copyright 2014 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |
URI: | http://hdl.handle.net/2433/191123 |
DOI(出版社版): | 10.1063/1.4896881 |
出現コレクション: | 学術雑誌掲載論文等 |
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