ブラウズ : 著者 Ha, D W
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| Analysis of the correlation between n-value and critical current in bent multifilamentary Bi2223 composite tape based on a damage evolution model Ochiai, S; Okuda, H; Fujimoto, M; Shin, J-K; Sugano, M; Hojo, M; Osamura, K; Oh, S S; Ha, D W (2012-04) Superconductor Science and Technology, 25(5) |  |