ブラウズ : 著者 Ha, D. W.
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Sample-length dependence of the critical current of slightly and significantly bent-damaged Bi2223 superconducting composite tape
Ochiai, S.; Fujimoto, M.; Okuda, H.; Oh, S. S.; Ha, D. W. (2007)
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 20(8): 800-809
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Simulation for prediction of distribution of critical current among specimens under low applied bending strains near the average irreversible strain in Bi2223 composite tape
Ochiai, S.; Fujimoto, M.; Okuda, H.; Oh, S. S.; Ha, D. W. (2010)
CRYOGENICS, 50(11-12): 765-771
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Simulation on the relation of distribution of overall critical transport current to that of local one in bent-damaged Bi2223 superconducting composite tape
Ochiai, S.; Fujimoto, M.; Okuda, H.; Oh, S. S.; Ha, D. W. (2009-03)
JOURNAL OF APPLIED PHYSICS, 105(6)
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Simulation on the relation of distribution of overall critical transport current to that of local one in bent-damaged Bi2223 superconducting composite tape
Ochiai, S.; Fujimoto, M.; Okuda, H.; Oh, S. S.; Ha, D. W. (2009)
JOURNAL OF APPLIED PHYSICS, 105(6)
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