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Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy
  Fukuma, T, Kobayashi, K, Horiuchi, T, Yamada, H, Matsushige, K (2000)
  JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 39(6B): 3830-3833