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| 書誌情報 | ファイル |
|---|---|
| Fine structure analysis of SiKL2,3V Auger spectra of Si, SiC and SiO2 Yamamoto, T; Sato, C; Mogi, M; Tanaka, I; Adachi, H (2004) JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 135(1): 21-25 | |
| First-principles calculations of silicon nitrides and SiAlONs Tanaka, I; Tatsumi, K; Oba, F; Adachi, H (2003) ADVANCED CERAMICS AND COMPOSITES, 247: 149-153 | |
| Dilute Ga dopant in TiO2 by X-ray absorption near-edge structure Okajima, T; Yamamoto, T; Kunisu, M; Yoshioka, S; Tanaka, I; Umesaki, N (2006) JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 45(9A): 7028-7031 | |
| Site-specific electronic structure analysis by channeling EELS and first-principles calculations Tatsumi, K; Muto, S; Yamamoto, Y; Ikeno, H; Yoshioka, S; Tanaka, I (2006) ULTRAMICROSCOPY, 106(11-12): 1019-1023 | |
| Theoretical investigation of AlK-edge X-ray absorption spectra of Al, AlN and Al2O3 Mogi, M; Yamamoto, T; Mizoguchi, T; Tatsumi, K; Yoshioka, S; Kameyama, S; Tanaka, I; Adachi, H (2004) MATERIALS TRANSACTIONS, 45(7): 2031-2034 |