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| 書誌情報 | ファイル |
|---|---|
| Influence of uniaxial mechanical stress on the high frequency performance of metal-oxide-semiconductor field effect transistors on (100) Si wafer Han, Younggun; Koganemaru, Masaaki; Ikeda, Toru; Miyazaki, Noriyuki; Choi, Woon; Tomokage, Hajime (2010) APPLIED PHYSICS LETTERS, 96(21) | |
| Evaluation of Stress Effects on Electrical Characteristics of N-Type MOSFETs: Variations of DC Characteristics During the Resin-Molding Process Koganemaru, Masaaki; Ikeda, Toru; Miyazaki, Noriyuki; Tomokage, Hajime (2010) JOURNAL OF ELECTRONIC PACKAGING, 132(1) | |
| Influence of uniaxial mechanical stress on the high frequency performance of metal-oxide-semiconductor field effect transistors on (100) Si wafer Han, Younggun; Koganemaru, Masaaki; Ikeda, Toru; Miyazaki, Noriyuki; Choi, Woon; Tomokage, Hajime (2010-05) APPLIED PHYSICS LETTERS, 96(21) |  |