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Title: Measuring Terminal Capacitance and Its Voltage Dependency for High-Voltage Power Devices
Authors: Funaki, Tsuyoshi  KAKEN_id  orcid https://orcid.org/0000-0001-8776-5118 (unconfirmed)
Phankong, Nathabhat
Kimoto, Tsunenobu  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-6649-2090 (unconfirmed)
Hikihara, Takashi  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-0029-4358 (unconfirmed)
Keywords: C-V characteristics
high-voltage power device
terminal capacitance
voltage dependency
Issue Date: 2009
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Journal title: IEEE TRANSACTIONS ON POWER ELECTRONICS
Volume: 24
Issue: 5-6
Start page: 1486
End page: 1493
URI: http://hdl.handle.net/2433/109608
DOI(Published Version): 10.1109/TPEL.2009.2016566
Link: Web of Science
Appears in Collections:Graduate School of Engineering Literature Database

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