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タイトル: Distribution of normalized critical current of bent multifilamentary Bi2223 composite tape
著者: Ochiai, S.
Fujimoto, M.
Shin, J. K.
Okuda, H.  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0001-7866-4876 (unconfirmed)
Oh, S. S.
Ha, D. W.
発行日: Nov-2009
出版者: American Institute of Physics
誌名: JOURNAL OF APPLIED PHYSICS
巻: 106
号: 10
論文番号: 103916
抄録: The distribution of the normalized critical transport current (critical current normalized with respect to the original value) of Bi2223/Ag/Ag alloy composite tape under bending strain of 0%–0.833% was studied experimentally and analytically. The experimental results were analyzed by a modeling approach based on the relation of the heterogeneous damage evolution to the distribution of the critical current. The main results are summarized as follows. (1) The measured distribution of the critical current values varying with bending strain was described well by the present approach. (2) When all specimens were damaged at high bending strains (0.338%–0.833% in the present work), the distribution of the critical current of the bent-damaged specimens was expressed by the three-parameter Weibull distribution function, the reason for which was revealed. (3) The distribution of the irreversible strain was estimated, with which the influence of the increase in the fraction of damaged specimens on the variation of critical current distribution in the low bending strain range (0%–0.35%) was elucidated.
著作権等: Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in JOURNAL OF APPLIED PHYSICS 106, 103916 (2009) and may be found at http://link.aip.org/link/JAPIAU/v106/i10/p103916/s1
URI: http://hdl.handle.net/2433/109906
DOI(出版社版): 10.1063/1.3259400
関連リンク: http://link.aip.org/link/JAPIAU/v106/i10/p103916/s1
出現コレクション:学術雑誌掲載論文等

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