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タイトル: The influence of parasitic components on power MOSFET switching operation in power conversion circuits
著者: Funaki, Tsuyoshi  KAKEN_id  orcid https://orcid.org/0000-0001-8776-5118 (unconfirmed)
Arioka, Hisato
Hikihara, Takashi  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-0029-4358 (unconfirmed)
著者名の別形: 引原, 隆士
キーワード: switching
parasitic inductance
mutual coupling
EMC
発行日: 10-Dec-2009
出版者: IEICE - Institute of Electronics, Information and Communication Engineers
引用: Tsuyoshi Funaki, Hisato Arioka and Takashi Hikihara, "The influence of parasitic components on power MOSFET switching operation in power conversion circuits", IEICE Electron. Express, Vol. 6, No. 23, pp.1697-1701, (2009) .
誌名: IEICE Electronics Express
巻: 6
号: 23
開始ページ: 1697
終了ページ: 1701
抄録: This paper discusses the quantification of parasitic components inherent in printed circuit board (PCB) wiring, which can be of considerable value in power conversion circuits. The influence of parasitic inductance and mutual coupling are evaluated in terms of electromagnetic compatibility (EMC) for the switching operation of power MOSFETs in a dc-dc buck converter. The parasitic components are identified based on the partial element equivalent circuit (PEEC) method and modeled with circuit simulation. The estimated effect of the parasitic component on the switching operation of a power MOSFET is validated by comparing it with experimental results.
著作権等: copyright©2009 IEICE
URI: http://hdl.handle.net/2433/109957
DOI(出版社版): 10.1587/elex.6.1697
出現コレクション:学術雑誌掲載論文等

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