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タイトル: On the magnification of two-dimensional contouring errors by using contour-parallel offsets
著者: IBARAKI, Soichi  kyouindb  KAKEN_id
MATSUBARA, Atsushi  kyouindb  KAKEN_id
著者名の別形: 茨木, 創一
キーワード: Contouring error
Measurement
Cross grid encoder
Contour-parallel offset
発行日: Oct-2009
出版者: Elsevier
引用: Soichi Ibaraki, Atsushi Matsubara, "On the magnification of two-dimensional contouring errors by using contour-parallel offsets," Precision Engineering, 33(4), pp. 322-326, 2009.
誌名: Precision Engineering
巻: 33
号: 4
開始ページ: 322
終了ページ: 326
抄録: The cross grid encoder is a diffraction grating type encoder to measure two-dimensional position of a optical head by using a grid plate, and is widely used in the industry to evaluate the two-dimensional contouring performance of a machine tool. In the graphical display of measured contouring error profiles, the error is often magnified to some given scale with respect to the reference trajectory. The conventional algorithm to compute the magnified contouring error profile, adopted in a commercial software to analyze an error profile measured by the cross grid encoder, makes the magnified trajectory discontinuous when the given reference trajectory is unsmooth, which makes it difficult to understand the magnified trajectory especially at corners. This paper proposes a new algorithm to compute the magnified trajectory of two-dimensional contouring error profiles such that the magnified trajectory becomes continuous even when the reference trajectory is unsmooth. Application examples are presented with error profiles obtained by using a cross grid encoder applied to a commercial machining center.
著作権等: Copyright © 2008 Elsevier
この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。This is not the published version. Please cite only the published version.
URI: http://hdl.handle.net/2433/123361
DOI(出版社版): 10.1016/j.precisioneng.2008.09.002
出現コレクション:学術雑誌掲載論文等

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