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タイトル: Field and polarity dependence of time-to-resistance increase in Fe–O films studied by constant voltage stress method
著者: Eriguchi, Koji  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0003-1485-5897 (unconfirmed)
Wei, Zhiqiang
Takagi, Takeshi
Ohta, Hiroaki
Ono, Kouichi  KAKEN_id
著者名の別形: 江利口, 浩二
キーワード: electrical conductivity
iron compounds
sputter deposition
switching
thermomechanical treatment
thin films
発行日: Jan-2009
出版者: American Institute of Physics
誌名: Applied Physics Letters
巻: 94
号: 1
論文番号: 013507
抄録: Constant voltage stress (CVS) was applied to Fe–O films prepared by a sputtering process to investigate a stress-induced resistance increase leading to a fundamental mechanism for switching behaviors. Under the CVS, an abrupt resistance increase was found for both stress polarities. A conduction mechanism after the resistance increase exhibited non-Ohmic transport. The time-to-resistance increase (tr) under the CVS was revealed to strongly depend on stress voltage as well as the polarity. From a polarity-dependent resistance increase determined by a time-zero measurement, the voltage and polarity-dependent tr were discussed on the basis of field- and structure-enhanced thermochemical reaction mechanisms.
著作権等: © 2009 American Institute of Physics
URI: http://hdl.handle.net/2433/137216
DOI(出版社版): 10.1063/1.3064127
出現コレクション:学術雑誌掲載論文等

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