Access count of this item: 0
Files in This Item:
There are no files associated with this item.
| Title: | Measurement of anisotropic fatigue life in micrometre-scale single-crystal silicon specimens |
| Authors: | Ikehara, T. Tsuchiya, T.    https://orcid.org/0000-0002-7846-5831 (unconfirmed) |
| Issue Date: | 2010 |
| Publisher: | INST ENGINEERING TECHNOLOGY-IET |
| Journal title: | MICRO & NANO LETTERS |
| Volume: | 5 |
| Issue: | 1 |
| Start page: | 49 |
| End page: | 52 |
| URI: | http://hdl.handle.net/2433/146625 |
| DOI(Published Version): | 10.1049/mnl.2009.0073 |
| Link: | Web of Science |
| Appears in Collections: | Graduate School of Engineering Literature Database |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.