1. Kyoto University Research Information Repository
  2. 090_Graduate School of Engineering
  3. Graduate School of Engineering Literature Database
Access count of this item: 0

    Please use this identifier to cite or link to this item: http://hdl.handle.net/2433/146627
Files in This Item:
There are no files associated with this item.
Title: Tensile Testing of Single-Crystal Silicon Thin Films at 600 degrees C Using Infrared Radiation Heating
Authors: Tsuchiya, Toshiyuki  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-7846-5831 (unconfirmed)
Ikeda, Tetsuro
Tsunematsu, Akifumi
Sugano, Koji
Tabata, Osamu  KAKEN_id
Keywords: single-crystal silicon
thin films
mechanical properties
tensile test
plastic deformation
Issue Date: 2010
Publisher: MYU
Journal title: SENSORS AND MATERIALS
Volume: 22
Issue: 1
Start page: 1
End page: 11
URI: http://hdl.handle.net/2433/146627
Link: Web of Science
Appears in Collections:Graduate School of Engineering Literature Database

Show full item record

Export to RefWorks


Export Format: 


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.