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dc.contributor.authorFeng, Ganen
dc.contributor.authorSuda, Junen
dc.contributor.authorKimoto, Tsunenobuen
dc.date.accessioned2011-09-13T00:29:09Z-
dc.date.available2011-09-13T00:29:09Z-
dc.date.issued2010-
dc.identifier.issn0021-4922-
dc.identifier.urihttp://hdl.handle.net/2433/146886-
dc.language.isoeng-
dc.publisherJAPAN SOC APPLIED PHYSICSen
dc.titleNondestructive Visualization of Individual Dislocations in 4H-SiC Epilayers by Micro Photoluminescence Mappingen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleJAPANESE JOURNAL OF APPLIED PHYSICSen
dc.identifier.volume49-
dc.identifier.issue9-
dc.relation.doi10.1143/JJAP.49.090201-
dc.textversionnone-
dc.identifier.artnum90201-
dcterms.accessRightsmetadata only access-
Appears in Collections:Graduate School of Engineering Literature Database

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