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dc.contributor.authorFeng, Ganen
dc.contributor.authorSuda, Junen
dc.contributor.authorKimoto, Tsunenobuen
dc.date.accessioned2011-09-13T00:29:14Z-
dc.date.available2011-09-13T00:29:14Z-
dc.date.issued2009-
dc.identifier.issn0921-4526-
dc.identifier.urihttp://hdl.handle.net/2433/146892-
dc.language.isoeng-
dc.publisherELSEVIER SCIENCE BVen
dc.subject4H-SiCen
dc.subjectMicro-photoluminescence mappingen
dc.subjectStacking faultsen
dc.subjectStacking sequenceen
dc.titleCharacterization of major in-grown stacking faults in 4H-SiC epilayersen
dc.typeconference paper-
dc.type.niitypeConference Paper-
dc.identifier.jtitlePHYSICA B-CONDENSED MATTERen
dc.identifier.volume404-
dc.identifier.issue23-24-
dc.identifier.spage4745-
dc.identifier.epage4748-
dc.relation.doi10.1016/j.physb.2009.08.189-
dc.textversionnone-
dcterms.accessRightsmetadata only access-
Appears in Collections:Graduate School of Engineering Literature Database

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