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| ファイル | 記述 | サイズ | フォーマット | |
|---|---|---|---|---|
| 1.3477995.pdf | 317.56 kB | Adobe PDF | 見る/開く |
| タイトル: | A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy |
| 著者: | Hosokawa, Yoshihiro Kobayashi, Kei    https://orcid.org/0000-0002-1409-6539 (unconfirmed)Oyabu, Noriaki Matsushige, Kazumi Yamada, Hirofumi |
| キーワード: | atomic force microscopy frequency modulation organic semiconductors oscillations semiconductor thin films |
| 発行日: | Sep-2010 |
| 出版者: | AMER INST PHYSICS |
| 誌名: | REVIEW OF SCIENTIFIC INSTRUMENTS |
| 巻: | 81 |
| 号: | 9 |
| 論文番号: | 093701 |
| 抄録: | We propose a general procedure to determine the optimum imaging parameters (spring constant and oscillation amplitude) to obtain the optimum resolution in frequency modulation atomic force microscopy. We calculated the effective signal-to-noise ratio for various spring constants and oscillation amplitudes, based on the measurement of frequency shift and energy dissipation versus tip-sample distance curves, to find the optimum. We applied this procedure for imaging a lead phthalocyanine (PbPc) thin film on a MoS2(0001) substrate, and found that the optimum parameters were about 5 N/m and 20 nm, respectively. An improved signal-to-noise ratio was attained in a preliminary experiment using parameters which were close to the calculated optimum. |
| 著作権等: | Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in REVIEW OF SCIENTIFIC INSTRUMENTS 81, 093701 (2010) and may be found at https://doi.org/10.1063/1.3477995. |
| URI: | http://hdl.handle.net/2433/147206 |
| DOI(出版社版): | 10.1063/1.3477995 |
| PubMed ID: | 20886981 |
| 関連リンク: | http://link.aip.org/link/RSINAK/v81/i9/p093701/s1 |
| 出現コレクション: | 学術雑誌掲載論文等 |
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