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タイトル: | Submolecular-scale Investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy |
著者: | Ichii, Takashi https://orcid.org/0000-0002-4021-8894 (unconfirmed) Fukuma, Takeshi Yoda, Tadashi Kobayashi, Kei https://orcid.org/0000-0002-1409-6539 (unconfirmed) Matsushige, Kazumi Yamada, Hirofumi |
キーワード: | atomic force microscopy electric moments monolayers organic compounds |
発行日: | 15-Jan-2010 |
出版者: | American Institute of Physics (AIP) |
誌名: | Journal of Applied Physics |
巻: | 107 |
号: | 2 |
論文番号: | 024315 |
抄録: | Copper-phthalocyanine (CuPc) monolayers and cobalt-phthalocyanine monolayers deposited on Au(111) surfaces were investigated by frequency modulation atomic force microscopy (FM-AFM). Submolecular-resolution topographic images were successfully obtained for both samples. Despite the similar molecular geometry of the two molecules, they showed clearly different contrasts in the topographic images. The origin of the contrast is discussed in terms of the relationship of the molecular orbitals and the chemical interaction between the tip and the molecules. In addition, a molecular-resolution surface potential (SP) image was obtained on CuPc monolayers using Kelvin probe force microscopy (KFM) utilizing FM-AFM. The molecular-scale SP contrast was explained by the electric dipole moment at the organic/metal interface. This result suggested the possibility of the detection of the single molecular dipole moment by KFM. |
著作権等: | Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in JOURNAL OF APPLIED PHYSICS107, 024315 (2010) and may be found at |
URI: | http://hdl.handle.net/2433/147209 |
DOI(出版社版): | 10.1063/1.3284094 |
関連リンク: | http://link.aip.org/link/JAPIAU/v107/i2/p024315/s1 |
出現コレクション: | 学術雑誌掲載論文等 |
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