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Title: Direct observation of crystal defects in an organic molecular crystals of copper hexachlorophthalocyanine by STEM-EELS
Authors: Haruta, Mitsutaka  kyouindb  KAKEN_id  orcid (unconfirmed)
Kurata, Hiroki  kyouindb  KAKEN_id  orcid (unconfirmed)
Author's alias: 治田, 充貴
Keywords: Electronic materials and devices
Materials physics
Issue Date: 7-Feb-2012
Publisher: Nature Publishing Group
Journal title: Scientific Reports
Volume: 2
Thesis number: 252
Abstract: The structural analysis of crystal defects in organic thin films provides fundamental insights into their electronic properties for applications such as field effect transistors. Observation of crystal defects in organic thin films has previously been performed at rather low resolution by conventional transmission electron microscopy based on phase-contrast imaging. Herein, we apply for the first time annular dark-field imaging to the direct observation of grain boundaries in copper hexachlorophthalocyanine thin films at the atomic resolution level by using an aberration-corrected scanning transmission electron microscope combined with electron energy-loss spectroscopy. By using a low-dose technique and an optimized detection angle, we were able to visualize the contrast of light element (C and N) together with the heavier elements (Cl and Cu) within the molecular column. We were also able to identify unexpected molecular orientations in the grain boundaries along the {110} crystallographic planes giving rise to stacking faults.
Description: 原子分解能で有機結晶薄膜中の欠陥構造観察に成功-有機デバイス材料の構造評価へ向けた新展開-. 京都大学プレスリリース. 2012-02-08.
Rights: Copyright © 2012, Rights Managed by Nature Publishing Group This work is licensed under a Creative Commons Attribution-NonCommercial-ShareALike 3.0 Unported License. To view a copy of this license, visit
DOI(Published Version): 10.1038/srep00252
PubMed ID: 22355764
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