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ファイル | 記述 | サイズ | フォーマット | |
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transfun.E93.A.2524.pdf | 651.93 kB | Adobe PDF | 見る/開く |
タイトル: | Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures |
著者: | IMAGAWA, Takashi HIROMOTO, Masayuki OCHI, Hiroyuki SATO, Takashi https://orcid.org/0000-0002-1577-8259 (unconfirmed) |
著者名の別形: | 今川, 隆司 佐藤, 高史 |
キーワード: | soft error TMR reliability methodology |
発行日: | Dec-2010 |
出版者: | The Institute of Electronics, Information and Communication Engineers |
誌名: | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
巻: | E93-A |
号: | 12 |
開始ページ: | 2524 |
終了ページ: | 2532 |
抄録: | This paper proposes a reliability evaluation environment for coarse-grained reconfigurable architectures. This environment is designed so that it can be easily extended to different target architectures and applications by automating the generation of the simulation inputs such as HDL codes for fault injection and configuration information. This automation enables us to explore a huge design space in order to efficiently analyze area/reliability trade-offs and find the best solution. This paper also shows demonstrative examples of the design space exploration of coarse-grained reconfigurable architectures using the proposed environment. Through the demonstrations, we discuss relationship between coarse-grained architectures and reliability, which has not yet been addressed in existing literatures and show the feasibility of the proposed environment. |
著作権等: | © 2011 The Institute of Electronics, Information and Communication Engineers |
URI: | http://hdl.handle.net/2433/156797 |
DOI(出版社版): | 10.1587/transfun.E93.A.2524 |
関連リンク: | http://www.ieice.org/jpn/index.html |
出現コレクション: | 学術雑誌掲載論文等 |
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