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タイトル: Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures
著者: IMAGAWA, Takashi
HIROMOTO, Masayuki  KAKEN_id
OCHI, Hiroyuki
SATO, Takashi  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-1577-8259 (unconfirmed)
著者名の別形: 今川, 隆司
佐藤, 高史
キーワード: soft error
TMR
reliability
methodology
発行日: Dec-2010
出版者: The Institute of Electronics, Information and Communication Engineers
誌名: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
巻: E93-A
号: 12
開始ページ: 2524
終了ページ: 2532
抄録: This paper proposes a reliability evaluation environment for coarse-grained reconfigurable architectures. This environment is designed so that it can be easily extended to different target architectures and applications by automating the generation of the simulation inputs such as HDL codes for fault injection and configuration information. This automation enables us to explore a huge design space in order to efficiently analyze area/reliability trade-offs and find the best solution. This paper also shows demonstrative examples of the design space exploration of coarse-grained reconfigurable architectures using the proposed environment. Through the demonstrations, we discuss relationship between coarse-grained architectures and reliability, which has not yet been addressed in existing literatures and show the feasibility of the proposed environment.
著作権等: © 2011 The Institute of Electronics, Information and Communication Engineers
URI: http://hdl.handle.net/2433/156797
DOI(出版社版): 10.1587/transfun.E93.A.2524
関連リンク: http://www.ieice.org/jpn/index.html
出現コレクション:学術雑誌掲載論文等

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