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Title: Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures
Authors: IMAGAWA, Takashi
HIROMOTO, Masayuki  kyouindb  KAKEN_id
OCHI, Hiroyuki
SATO, Takashi  kyouindb  KAKEN_id  orcid (unconfirmed)
Author's alias: 今川, 隆司
佐藤, 高史
Keywords: soft error
Issue Date: Dec-2010
Publisher: The Institute of Electronics, Information and Communication Engineers
Journal title: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Volume: E93-A
Issue: 12
Start page: 2524
End page: 2532
Abstract: This paper proposes a reliability evaluation environment for coarse-grained reconfigurable architectures. This environment is designed so that it can be easily extended to different target architectures and applications by automating the generation of the simulation inputs such as HDL codes for fault injection and configuration information. This automation enables us to explore a huge design space in order to efficiently analyze area/reliability trade-offs and find the best solution. This paper also shows demonstrative examples of the design space exploration of coarse-grained reconfigurable architectures using the proposed environment. Through the demonstrations, we discuss relationship between coarse-grained architectures and reliability, which has not yet been addressed in existing literatures and show the feasibility of the proposed environment.
Rights: © 2011 The Institute of Electronics, Information and Communication Engineers
DOI(Published Version): 10.1587/transfun.E93.A.2524
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