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タイトル: | Specimen- and grain-size dependence of compression deformation behavior in nanocrystalline copper |
著者: | Okamoto, Norihiko L. Kashioka, Daisuke Hirato, Tetsuji https://orcid.org/0000-0003-3030-1632 (unconfirmed) Inui, Haruyuki https://orcid.org/0000-0003-0835-6725 (unconfirmed) |
著者名の別形: | 岡本, 範彦 |
キーワード: | Dislocations (A) Crystal plasticity (B) Polycrystalline material (B) Mechanical testing (C) Focused ion beam (FIB) method |
発行日: | May-2014 |
出版者: | Elsevier Ltd. |
誌名: | International Journal of Plasticity |
巻: | 56 |
開始ページ: | 173 |
終了ページ: | 183 |
抄録: | The compression deformation behavior of electrodeposited nanocrystalline copper pillars with average grain sizes (d) of 360, 100, and 34 nm has been investigated as a function of specimen size (D). The yield stress for nanocrystalline pillars with d = 360 and 100 nm does not depend on specimen size, exhibiting essentially the bulk yield stress until the specimen size is reduced down to the critical values ((D/d)∗ = 35 and 85), below which the yield stress decreases with the decrease in specimen size. In contrast, the yield stress for nanocrystalline pillars with d = 34 nm does not depend much on specimen size, exhibiting the bulk yield stress value for all specimen sizes investigated. The dominant deformation mechanism changes from dislocation glide for pillars with d = 360 and 100 nm to grain boundary diffusional creep for pillars with d = 34 nm. Grain-size induced softening occurs for pillars with d = 34 nm being consistent with the occurrence of change in deformation mechanisms, whereas the bulk yield stress for pillars with d = 360 and 100 nm increases with the decrease in grain size according to the classical Hall–Petch relationship. The critical (D/d)∗ values determined for nanocrystalline Cu pillars with d = 360 and 100 nm increases with the decrease in grain size so as to conform to the same power law scaling obtained for coarse-grained Cu polycrystals. This is the first indication that the specimen size-induced softening extends from micrometer to nanometer scales as far as the dominant deformation mechanism is dislocation glide. The considerably large critical (D/d)∗ values determined for nanocrystalline Cu pillars with d = 360 and 100 nm are discussed in terms of strain continuity among neighboring grains and the generation of geometrically necessary dislocations to maintain strain continuity at the grain boundaries. |
著作権等: | © 2013 Elsevier Ltd. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。 This is not the published version. Please cite only the published version. |
URI: | http://hdl.handle.net/2433/187145 |
DOI(出版社版): | 10.1016/j.ijplas.2013.12.003 |
出現コレクション: | 学術雑誌掲載論文等 |
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