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タイトル: | Resolving the EH[6/7] level in 4H-SiC by Laplace-transform deep level transient spectroscopy |
著者: | Alfieri, G. Kimoto, T. ![]() ![]() ![]() |
発行日: | 16-Apr-2013 |
出版者: | AIP Publishing |
誌名: | Applied Physics Letters |
巻: | 102 |
号: | 15 |
論文番号: | 152108 |
抄録: | We show that Laplace transform deep level transient spectroscopy (LDLTS) is an effective technique for the separation of the overlapping emission rates of the EH 6 and EH 7 levels, which are known to constitute EH[6/7] , a mid-gap level in n-type 4H-SiC. The analysis of the electron irradiation dose, electric field dependence, and the effects of carbon interstitials injection on the emission rates of EH 6 and EH 7 shows that EH 7 is dominant over EH 6 and confirms that their nature is related to a carbon vacancy. |
著作権等: | © 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |
URI: | http://hdl.handle.net/2433/187951 |
DOI(出版社版): | 10.1063/1.4802248 |
出現コレクション: | 学術雑誌掲載論文等 |

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