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Title: Resolving the EH[6/7] level in 4H-SiC by Laplace-transform deep level transient spectroscopy
Authors: Alfieri, G.
Kimoto, T.  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-6649-2090 (unconfirmed)
Issue Date: 16-Apr-2013
Publisher: AIP Publishing
Journal title: Applied Physics Letters
Volume: 102
Issue: 15
Thesis number: 152108
Abstract: We show that Laplace transform deep level transient spectroscopy (LDLTS) is an effective technique for the separation of the overlapping emission rates of the EH 6 and EH 7 levels, which are known to constitute EH[6/7] , a mid-gap level in n-type 4H-SiC. The analysis of the electron irradiation dose, electric field dependence, and the effects of carbon interstitials injection on the emission rates of EH 6 and EH 7 shows that EH 7 is dominant over EH 6 and confirms that their nature is related to a carbon vacancy.
Rights: © 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
URI: http://hdl.handle.net/2433/187951
DOI(Published Version): 10.1063/1.4802248
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