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タイトル: Possibility of Scanning Electron Microscope Observation and Energy Dispersive X-Ray Analysis in Microscale Region of Insulating Samples Using Diluted Ionic Liquid
著者: Imashuku, Susumu
Kawakami, Tetsuo  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-5921-5562 (unconfirmed)
Zea, Long
Kawai, Jun  KAKEN_id  orcid https://orcid.org/0000-0002-1289-7666 (unconfirmed)
キーワード: ionic liquid
SEM
EDX
insulating sample
electrical charging
microscale region
発行日: Apr-2012
出版者: Cambridge University Press
誌名: Microscopy and Microanalysis
巻: 18
号: 2
開始ページ: 365
終了ページ: 370
抄録: The possibility of scanning electron microscope (SEM) observation and energy dispersive X-ray (EDX) spectrometry analysis in microscale regions of insulating samples using diluted ionic liquid was investigated. It is possible to obtain clear secondary electron images of insulating samples such as a rock and mineral at 5, 000 times magnification by dropping 10 μL of 1 wt% of 1-ethyl-3-methylimidazolium acetate (EMI-CH3COO) diluted with ethanol onto the samples. We also obtained EDX spectra of the samples in microscale regions (∼5 μm2) without overlapping EDX spectra of other minerals with different composition. It might be possible to perform quantitative analysis of the samples if a method that does not need standard samples is applied or an X-ray detector sensitive for light elements was attached. The method of dropping 1 wt% EMI-CH3COO diluted with ethanol onto insulating samples is useful for SEM observation, EDX analysis in microscale regions, and the preservation of scarce rock and mineral samples because ionic liquid can be easily removed with acetone.
記述: Published online: 27 February 2012
著作権等: © Microscopy Society of America 2012
URI: http://hdl.handle.net/2433/194122
DOI(出版社版): 10.1017/s1431927611012669
出現コレクション:学術雑誌掲載論文等

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