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Title: Possibility of Scanning Electron Microscope Observation and Energy Dispersive X-Ray Analysis in Microscale Region of Insulating Samples Using Diluted Ionic Liquid
Authors: Imashuku, Susumu
Kawakami, Tetsuo  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-5921-5562 (unconfirmed)
Zea, Long
Kawai, Jun  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-1289-7666 (unconfirmed)
Keywords: ionic liquid
SEM
EDX
insulating sample
electrical charging
microscale region
Issue Date: Apr-2012
Publisher: Cambridge University Press
Journal title: Microscopy and Microanalysis
Volume: 18
Issue: 2
Start page: 365
End page: 370
Abstract: The possibility of scanning electron microscope (SEM) observation and energy dispersive X-ray (EDX) spectrometry analysis in microscale regions of insulating samples using diluted ionic liquid was investigated. It is possible to obtain clear secondary electron images of insulating samples such as a rock and mineral at 5, 000 times magnification by dropping 10 μL of 1 wt% of 1-ethyl-3-methylimidazolium acetate (EMI-CH3COO) diluted with ethanol onto the samples. We also obtained EDX spectra of the samples in microscale regions (∼5 μm2) without overlapping EDX spectra of other minerals with different composition. It might be possible to perform quantitative analysis of the samples if a method that does not need standard samples is applied or an X-ray detector sensitive for light elements was attached. The method of dropping 1 wt% EMI-CH3COO diluted with ethanol onto insulating samples is useful for SEM observation, EDX analysis in microscale regions, and the preservation of scarce rock and mineral samples because ionic liquid can be easily removed with acetone.
Description: Published online: 27 February 2012
Rights: © Microscopy Society of America 2012
URI: http://hdl.handle.net/2433/194122
DOI(Published Version): 10.1017/s1431927611012669
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