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| ファイル | 記述 | サイズ | フォーマット | |
|---|---|---|---|---|
| 1.4928515.pdf | 673 kB | Adobe PDF | 見る/開く |
| タイトル: | Material degradation of liquid organic semiconductors analyzed by nuclear magnetic resonance spectroscopy |
| 著者: | Fukushima, Tatsuya Yamamoto, Junichi Fukuchi, Masashi Hirata, Shuzo Jung, Heo Hyo Hirata, Osamu Shibano, Yuki Adachi, Chihaya Kaji, Hironori    https://orcid.org/0000-0002-5111-3852 (unconfirmed) |
| 著者名の別形: | 安達, 千波矢 梶, 弘典 |
| キーワード: | Nuclear magnetic resonance Organic light emitting diodes Liquid semiconductors Organic liquids Active layer |
| 発行日: | Aug-2015 |
| 出版者: | American Institute of Physics |
| 誌名: | AIP Advances |
| 巻: | 5 |
| 号: | 8 |
| 論文番号: | 087124 |
| 抄録: | Liquid organic light-emitting diodes (liquid OLEDs) are unique devices consisting only of liquid organic semiconductors in the active layer, and the device performances have been investigated recently. However, the device degradation, especially, the origin has been unknown. In this study, we show that material degradation occurs in liquid OLEDs, whose active layer is composed of carbazole with an ethylene glycol chain. Nuclear magnetic resonance (NMR) experiments clearly exhibit that the dimerization reaction of carbazole moiety occurs in the liquid OLEDs during driving the devices. In contrast, cleavages of the ethylene glycol chain are not detected within experimental error. The dimerization reaction is considered to be related to the device degradation. |
| 著作権等: | © 2015 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License. |
| URI: | http://hdl.handle.net/2433/200750 |
| DOI(出版社版): | 10.1063/1.4928515 |
| 出現コレクション: | 学術雑誌掲載論文等 |
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