Downloads: 325

Files in This Item:
File Description SizeFormat 
1.4928515.pdf673 kBAdobe PDFView/Open
Title: Material degradation of liquid organic semiconductors analyzed by nuclear magnetic resonance spectroscopy
Authors: Fukushima, Tatsuya
Yamamoto, Junichi
Fukuchi, Masashi
Hirata, Shuzo
Jung, Heo Hyo
Hirata, Osamu
Shibano, Yuki
Adachi, Chihaya
Kaji, Hironori  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-5111-3852 (unconfirmed)
Author's alias: 安達, 千波矢
梶, 弘典
Keywords: Nuclear magnetic resonance
Organic light emitting diodes
Liquid semiconductors
Organic liquids
Active layer
Issue Date: Aug-2015
Publisher: American Institute of Physics
Journal title: AIP Advances
Volume: 5
Issue: 8
Thesis number: 087124
Abstract: Liquid organic light-emitting diodes (liquid OLEDs) are unique devices consisting only of liquid organic semiconductors in the active layer, and the device performances have been investigated recently. However, the device degradation, especially, the origin has been unknown. In this study, we show that material degradation occurs in liquid OLEDs, whose active layer is composed of carbazole with an ethylene glycol chain. Nuclear magnetic resonance (NMR) experiments clearly exhibit that the dimerization reaction of carbazole moiety occurs in the liquid OLEDs during driving the devices. In contrast, cleavages of the ethylene glycol chain are not detected within experimental error. The dimerization reaction is considered to be related to the device degradation.
Rights: © 2015 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
URI: http://hdl.handle.net/2433/200750
DOI(Published Version): 10.1063/1.4928515
Appears in Collections:Journal Articles

Show full item record

Export to RefWorks


Export Format: 


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.