|Title:||Radio-frequency capacitance spectroscopy of metallic nanoparticles.|
|Authors:||Frake, James C.|
Sakamoto, Masanori https://orcid.org/0000-0001-5018-5590 (unconfirmed)
Teranishi, Toshiharu https://orcid.org/0000-0002-5818-8865 (unconfirmed)
Smith, Charles G.
Buitelaar, Mark R.
|Author's alias:||寺西, 利治|
|Publisher:||Nature Publishing Group|
|Journal title:||Scientific reports|
|Abstract:||Recent years have seen great progress in our understanding of the electronic properties of nanomaterials in which at least one dimension measures less than 100 nm. However, contacting true nanometer scale materials such as individual molecules or nanoparticles remains a challenge as even state-of-the-art nanofabrication techniques such as electron-beam lithography have a resolution of a few nm at best. Here we present a fabrication and measurement technique that allows high sensitivity and high bandwidth readout of discrete quantum states of metallic nanoparticles which does not require nm resolution or precision. This is achieved by coupling the nanoparticles to resonant electrical circuits and measurement of the phase of a reflected radio-frequency signal. This requires only a single tunnel contact to the nanoparticles thus simplifying device fabrication and improving yield and reliability. The technique is demonstrated by measurements on 2. 7 nm thiol coated gold nanoparticles which are shown to be in excellent quantitative agreement with theory.|
|Rights:||This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/|
|Appears in Collections:||Journal Articles|
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