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タイトル: | Size dependence of structural parameters in fcc and hcp Ru nanoparticles, revealed by Rietveld refinement analysis of high-energy X-ray diffraction data. |
著者: | Song, Chulho Sakata, Osami Kumara, Loku Singgappulige Rosantha Kohara, Shinji Yang, Anli Kusada, Kohei ![]() ![]() Kobayashi, Hirokazu Kitagawa, Hiroshi ![]() ![]() ![]() |
著者名の別形: | 坂田, 修身 草田, 康平 北川, 宏 |
発行日: | 10-Aug-2016 |
出版者: | Springer Nature |
誌名: | Scientific reports |
巻: | 6 |
論文番号: | 31400 |
抄録: | To reveal the origin of the CO oxidation activity of Ruthenium nanoparticles (Ru NPs), we structurally characterized Ru NPs through Rietveld refinement analysis of high-energy X-ray diffraction data. For hexagonal close-packed (hcp) Ru NPs, the CO oxidation activity decreased with decreasing domain surface area. However, for face-centered cubic (fcc) Ru NPs, the CO oxidation activity became stronger with decreasing domain surface area. In comparing fcc Ru NPs with hcp Ru NPs, we found that the hcp Ru NPs of approximately 2 nm, which had a smaller domain surface area and smaller atomic displacement, showed a higher catalytic activity than that of fcc Ru NPs of the same size. In contrast, fcc Ru NPs larger than 3.5 nm, which had a larger domain surface area, lattice distortion, and larger atomic displacement, exhibited higher catalytic activity than that of hcp Ru NPs of the same size. In addition, the fcc Ru NPs had larger atomic displacements than hcp Ru NPs for diameters ranging from 2.2 to 5.4 nm. Enhancement of the CO oxidation activity in fcc Ru NPs may be caused by an increase in imperfections due to lattice distortions of close-packed planes and static atomic displacements. |
記述: | Ruナノ粒子の構造と触媒活性との関連を見いだす : 局所構造, 平均構造の数値化で実現 機械学習用データを集積し新材料の創製に貢献. 京都大学プレスリリース. 2016-11-01. |
著作権等: | © The Author(s) 2016. This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
URI: | http://hdl.handle.net/2433/217248 |
DOI(出版社版): | 10.1038/srep31400 |
PubMed ID: | 27506187 |
関連リンク: | https://www.kyoto-u.ac.jp/ja/research-news/2016-11-01 |
出現コレクション: | 学術雑誌掲載論文等 |

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