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dc.contributor.author | Shioya, Nobutaka | en |
dc.contributor.author | Shimoaka, Takafumi | en |
dc.contributor.author | Murdey, Richard | en |
dc.contributor.author | Hasegawa, Takeshi | en |
dc.contributor.alternative | 長谷川, 健 | ja |
dc.date.accessioned | 2017-06-12T04:55:52Z | - |
dc.date.available | 2017-06-12T04:55:52Z | - |
dc.date.issued | 2017-06 | - |
dc.identifier.issn | 0003-7028 | - |
dc.identifier.uri | http://hdl.handle.net/2433/225284 | - |
dc.description.abstract | Infrared (IR) p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) is a powerful tool for analyzing the molecular orientation in an organic thin film. In particular, pMAIRS works powerfully for a thin film with a highly rough surface irrespective of degree of the crystallinity. Recently, the optimal experimental condition has comprehensively been revealed, with which the accuracy of the analytical results has largely been improved. Regardless, some unresolved matters still remain. A structurally isotropic sample, for example, yields different peak intensities in the in-plane and out-of-plane spectra. In the present study, this effect is shown to be due to the refractive index of the sample film and a correction factor has been developed using rigorous theoretical methods. As a result, with the use of the correction factor, organic materials having atypical refractive indices such as perfluoroalkyl compounds (n = 1.35) and fullerene (n = 1.83) can be analyzed with high accuracy comparable to a compound having a normal refractive index of approximately 1.55. With this improved technique, we are also ready for discriminating an isotropic structure from an oriented sample having the magic angle of 54.7°. | en |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | SAGE Publications | en |
dc.rights | The final, definitive version of this paper has been published in 'Applied Spectroscopy, Volume 71, Issue 6, pp 1242-1248, June 2017' by SAGE Publications Ltd, All rights reserved. ©The Author(s) | en |
dc.rights | This is not the published version. Please cite only the published version. | en |
dc.rights | この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。 | ja |
dc.subject | Instrumentation | en |
dc.subject | Spectroscopy | en |
dc.title | Accurate Molecular Orientation Analysis Using Infrared pMAIRS Considering the Refractive Index of the Thin Film Sample | en |
dc.type | journal article | - |
dc.type.niitype | Journal Article | - |
dc.identifier.jtitle | Applied Spectroscopy | en |
dc.identifier.volume | 71 | - |
dc.identifier.issue | 6 | - |
dc.identifier.spage | 1242 | - |
dc.identifier.epage | 1248 | - |
dc.relation.doi | 10.1177/0003702816676492 | - |
dc.textversion | author | - |
dc.address | Laboratory of Solution and Interface Chemistry, Division of Environmental Chemistry, Institute for Chemical Research, Kyoto University | en |
dc.address | Laboratory of Solution and Interface Chemistry, Division of Environmental Chemistry, Institute for Chemical Research, Kyoto University | en |
dc.address | Laboratory of Molecular Aggregation Analysis, Division of Multidisciplinary Chemistry, Institute for Chemical Research, Kyoto University | en |
dc.address | Laboratory of Solution and Interface Chemistry, Division of Environmental Chemistry, Institute for Chemical Research, Kyoto University | en |
dc.identifier.pmid | 28534674 | - |
dcterms.accessRights | open access | - |
出現コレクション: | 学術雑誌掲載論文等 |
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