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タイトル: | Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements |
著者: | Kukk, Edwin Motomura, Koji Fukuzawa, Hironobu Nagaya, Kiyonobu Ueda, Kiyoshi |
著者名の別形: | 永谷, 清信 |
キーワード: | free electron laser Coulomb explosion radiation damage molecular dynamics X-ray absorption ultrafast dissociation coincidence photoion-photoion coincidence (PIPICO) ion mass spectroscopy time-of-flight |
発行日: | 19-May-2017 |
出版者: | MDPI AG |
誌名: | Applied Sciences |
巻: | 7 |
号: | 5 |
論文番号: | 531 |
抄録: | X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniques, in particular multi-ion time-of-flight (TOF) coincident experiments, can provide detailed information on the photoabsorption, charge generation, and Coulomb explosion events. Here we review several such recent experiments performed at the SPring-8 Angstrom Compact free electron LAser (SACLA) facility in Japan, with iodomethane, diiodomethane, and 5-iodouracil as targets. We demonstrate how to utilize the momentum-resolving capabilities of the ion TOF spectrometers to resolve and filter the coincidence data and extract various information essential in understanding the time evolution of the processes induced by the XFEL pulses. |
著作権等: | © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0). |
URI: | http://hdl.handle.net/2433/232861 |
DOI(出版社版): | 10.3390/app7050531 |
出現コレクション: | 学術雑誌掲載論文等 |
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