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Title: Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements
Authors: Kukk, Edwin
Motomura, Koji
Fukuzawa, Hironobu
Nagaya, Kiyonobu  kyouindb  KAKEN_id
Ueda, Kiyoshi
Author's alias: 永谷, 清信
Keywords: free electron laser
Coulomb explosion
radiation damage
molecular dynamics
X-ray absorption
ultrafast dissociation
coincidence
photoion-photoion coincidence (PIPICO)
ion mass spectroscopy
time-of-flight
Issue Date: 19-May-2017
Publisher: MDPI AG
Journal title: Applied Sciences
Volume: 7
Issue: 5
Thesis number: 531
Abstract: X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniques, in particular multi-ion time-of-flight (TOF) coincident experiments, can provide detailed information on the photoabsorption, charge generation, and Coulomb explosion events. Here we review several such recent experiments performed at the SPring-8 Angstrom Compact free electron LAser (SACLA) facility in Japan, with iodomethane, diiodomethane, and 5-iodouracil as targets. We demonstrate how to utilize the momentum-resolving capabilities of the ion TOF spectrometers to resolve and filter the coincidence data and extract various information essential in understanding the time evolution of the processes induced by the XFEL pulses.
Rights: © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).
URI: http://hdl.handle.net/2433/232861
DOI(Published Version): 10.3390/app7050531
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