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Title: Efficient Aging-aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation
Authors: AWANO, Hiromitsu  kyouindb  KAKEN_id
SATO, Takashi  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-1577-8259 (unconfirmed)
Author's alias: 佐藤, 高史
Keywords: failure probability calculation
NBTI
Monte Carlo
subset simulation
augmented reliability
Issue Date: 2017
Publisher: Institute of Electronics, Information and Communications Engineers (IEICE)
Journal title: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Volume: E100-A
Issue: 12
Start page: 2807
End page: 2815
Abstract: A circuit-aging simulation that efficiently calculates temporal change of rare circuit-failure probability is proposed. While conventional methods required a long computational time due to the necessity of conducting separate calculations of failure probability at each device age, the proposed Monte Carlo based method requires to run only a single set of simulation. By applying the augmented reliability and subset simulation framework, the change of failure probability along the lifetime of the device can be evaluated through the analysis of the Monte Carlo samples. Combined with the two-step sample generation technique, the proposed method reduces the computational time to about 1/6 of that of the conventional method while maintaining a sufficient estimation accuracy.
Rights: © 2017 The Institute of Electronics, Information and Communication Engineers
URI: http://hdl.handle.net/2433/241785
DOI(Published Version): 10.1587/transfun.E100.A.2807
Appears in Collections:Journal Articles

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