Downloads: 0

Files in This Item:
File Description SizeFormat 
1347-4065_ab3617.pdf3.18 MBAdobe PDFView/Open
Full metadata record
DC FieldValueLanguage
dc.contributor.authorYamada, Yuya
dc.contributor.authorIchii, Takashi
dc.contributor.authorUtsunomiya, Toru
dc.contributor.authorSugimura, Hiroyuki
dc.contributor.alternative山田, 祐也
dc.contributor.alternative一井, 崇
dc.contributor.alternative宇都宮, 徹
dc.contributor.alternative杉村, 博之
dc.date.accessioned2019-10-15T05:18:01Z-
dc.date.available2019-10-15T05:18:01Z-
dc.date.issued2019-09-01
dc.identifier.issn0021-4922
dc.identifier.urihttp://hdl.handle.net/2433/244293-
dc.description.abstractSimultaneous detection of vertical and lateral forces at the nanoscale by atomic force microscopy (AFM) yields important knowledge on nanotribology. Although silicon (Si) cantilevers are capable of detecting both the forces, it has not been achieved by quartz tuning fork sensors including qPlus sensors. In this study, we found that the tip apex of the qPlus sensor with a long tip oscillates vertically at the lowest resonance frequency (ƒ₁) and laterally at the second lowest resonance frequency (ƒ₂) by the finite element method simulation. The lateral oscillation was experimentally confirmed by atomic resolution imaging, where the imaged atoms were apparently connected when increasing the oscillating amplitude at ƒ₂. We also demonstrated the nanometer-scale friction force measurement by using the developed bimodal AFM. The obtained result was in good agreement with the contact-mode lateral force microscopy utilizing a Si cantilever.
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherJapan Society of Applied Physics
dc.rightsThis is a peer-reviewed, un-copyedited version of an article accepted for publication/published in Japanese Journal of Applied Physics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.7567/1347-4065/ab3617.
dc.rightsThe full-text file will be made open to the public on 13 August 2020 in accordance with publisher's 'Terms and Conditions for Self-Archiving'.
dc.rightsThis is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
dc.titleSimultaneous detection of vertical and lateral forces by bimodal AFM utilizing quartz tuning fork sensor with a long tip
dc.type.niitypeJournal Article
dc.identifier.jtitleJapanese Journal of Applied Physics
dc.identifier.volume58
dc.identifier.issue9
dc.relation.doi10.7567/1347-4065/ab3617
dc.textversionauthor
dc.identifier.artnum095003
dc.addressDepartment of Materials Science and Engineering, Graduate School of Engineering, Kyoto University
dc.addressDepartment of Materials Science and Engineering, Graduate School of Engineering, Kyoto University
dc.addressDepartment of Materials Science and Engineering, Graduate School of Engineering, Kyoto University
dc.identifier.kaken17H02787
Appears in Collections:Journal Articles

Show simple item record

Export to RefWorks


Export Format: 


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.