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| ファイル | 記述 | サイズ | フォーマット | |
|---|---|---|---|---|
| j.elecom.2020.106740.pdf | 2.39 MB | Adobe PDF | 見る/開く |
| タイトル: | In situ synchrotron X-ray diffraction study of the electrochemical reduction of SiO₂ in molten CaCl₂ |
| 著者: | Katasho, Yumi Norikawa, Yutaro    https://orcid.org/0000-0002-0861-5443 (unconfirmed)Yamamoto, Takayuki https://orcid.org/0000-0003-3553-3272 (unconfirmed)Yasuda, Kouji Nohira, Toshiyuki |
| 著者名の別形: | 片所, 優宇美 法川, 勇太郎 山本, 貴之 安田, 幸司 野平, 俊之 |
| キーワード: | Molten salt In situ analysis Energy-dispersive X-ray diffraction SiO₂ Electrochemical reduction CaCl₂ |
| 発行日: | Jun-2020 |
| 出版者: | Elsevier BV |
| 誌名: | Electrochemistry Communications |
| 巻: | 115 |
| 論文番号: | 106740 |
| 抄録: | In situ synchrotron X-ray diffraction was used to investigate the electrochemical reduction of SiO₂ to Si in molten CaCl₂ at 1123 K for the first time. The present technique enabled direct determination of intermediate products at high temperature, without cooling and washing treatments. Based on the diffraction data, the Ca₂SiO₄ phase was detected inside the electrode, but not at the electrode edge. These results were explained by the presence of different concentrations of O²⁻ ions in molten CaCl₂ permeating different regions of the electrode. |
| 著作権等: | © 2020 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/BY-NC-ND/4.0/). |
| URI: | http://hdl.handle.net/2433/250846 |
| DOI(出版社版): | 10.1016/j.elecom.2020.106740 |
| 出現コレクション: | 学術雑誌掲載論文等 |
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