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タイトル: Raman Analysis and Electrochemical Reduction of Silicate Ions in Molten NaCl–CaCl₂
著者: Ma, Yuanjia
Yamamoto, Takayuki  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0003-3553-3272 (unconfirmed)
Yasuda, Kouji
Nohira, Toshiyuki  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-4053-554X (unconfirmed)
著者名の別形: 山本, 貴之
安田, 幸司
野平, 俊之
発行日: Apr-2021
出版者: The Electrochemical Society
IOP Publishing
誌名: Journal of The Electrochemical Society
巻: 168
号: 4
論文番号: 046515
抄録: This study investigated the ionic species and electrochemical reduction of silicate ions at a solid graphite electrode in molten NaCl–CaCl₂ eutectic melts with various concentrations of O²⁻ ion at 1023 K. Silicate ion species in the melts with various O²⁻/SiO₂ ratios (${r}_{{O}^{2-}/{text{SiO}}_{2}})$ were determined by Raman spectroscopy. The dominant species was SiO₃²⁻ for ${r}_{{O}^{2-}/{text{SiO}}_{2}}$ = 1.0, and SiO44− for ${r}_{{O}^{2-}/{text{SiO}}_{2}}$ = 1.5 and 2.0. From cyclic voltammetry, XRD, and SEM analyses, electrochemical reduction was indicated for SiO₃²⁻ and SiO₄⁴⁻ at more negative than 1.0 V and 0.80 V vs Na⁺/Na, respectively. Formation of CaSi₂ was confirmed at 0.50 V in all molten salts with ${r}_{{O}^{2-}/{text{SiO}}_{2}}$ = 1.0, 1.5, and 2.0. The potential ranges for pure Si deposition are almost the same in molten salts with ${r}_{{O}^{2-}/{text{SiO}}_{2}}$ = 1.0 and 1.5.
著作権等: © 2021 The Author(s). Published on behalf of The Electrochemical Society by IOP Publishing Limited
This is an open access article distributed under the terms of the Creative Commons Attribution Non-Commercial No Derivatives 4.0 License (CC BY-NC-ND, http://creativecommons.org/licenses/by-nc-nd/4.0/), which permits non-commercial reuse, distribution, and reproduction in any medium, provided the original work is not changed in any way and is properly cited.
URI: http://hdl.handle.net/2433/274210
DOI(出版社版): 10.1149/1945-7111/abf4b2
出現コレクション:学術雑誌掲載論文等

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