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タイトル: | Engineering of Fermi level by nin diamond junction for control of charge states of NV centers |
著者: | Murai, T. Makino, T. Kato, H. Shimizu, M. Murooka, T. Herbschleb, E. D. Doi, Y. Morishita, H. Fujiwara, M. Hatano, M. Yamasaki, S. Mizuochi, N. |
著者名の別形: | 森下, 弘樹 藤原, 正規 水落, 憲和 |
発行日: | 12-Mar-2018 |
出版者: | AIP Publishing |
誌名: | Applied Physics Letters |
巻: | 112 |
号: | 11 |
論文番号: | 111903 |
抄録: | The charge-state control of nitrogen-vacancy (NV) centers in diamond is very important toward its applications because the NV centers undergo stochastic charge-state transitions between the negative charge state (NV⁻) and the neutral charge state (NV⁰) of the NV center upon illumination. In this letter, engineering of the Fermi level by a nin diamond junction was demonstrated for the control of the charge state of the NV centers in the intrinsic (i) layer region. By changing the size (d) of the i-layer region between the phosphorus-doped n-type layer regions (nin) from 2 μm to 10 μm, we realized the gradual change in the NV− charge-state population in the i-layer region from 60% to 80% under 532 nm excitation, which can be attributed to the band bending in the i-layer region. Also, we quantitatively simulated the changes in the Fermi level in the i-layer region depending on d with various concentrations of impurities in the i-layer region. |
著作権等: | © 2018 Author(s). Published by AIP Publishing. The full-text file will be made open to the public on 13 March 2019 in accordance with publisher's 'Terms and Conditions for Self-Archiving'. |
URI: | http://hdl.handle.net/2433/279885 |
DOI(出版社版): | 10.1063/1.5010956 |
出現コレクション: | 学術雑誌掲載論文等 |

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