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タイトル: Engineering of Fermi level by nin diamond junction for control of charge states of NV centers
著者: Murai, T.
Makino, T.
Kato, H.
Shimizu, M.
Murooka, T.
Herbschleb, E. D.
Doi, Y.
Morishita, H.
Fujiwara, M.
Hatano, M.
Yamasaki, S.
Mizuochi, N.
著者名の別形: 森下, 弘樹
藤原, 正規
水落, 憲和
発行日: 12-Mar-2018
出版者: AIP Publishing
誌名: Applied Physics Letters
巻: 112
号: 11
論文番号: 111903
抄録: The charge-state control of nitrogen-vacancy (NV) centers in diamond is very important toward its applications because the NV centers undergo stochastic charge-state transitions between the negative charge state (NV⁻) and the neutral charge state (NV⁰) of the NV center upon illumination. In this letter, engineering of the Fermi level by a nin diamond junction was demonstrated for the control of the charge state of the NV centers in the intrinsic (i) layer region. By changing the size (d) of the i-layer region between the phosphorus-doped n-type layer regions (nin) from 2 μm to 10 μm, we realized the gradual change in the NV− charge-state population in the i-layer region from 60% to 80% under 532 nm excitation, which can be attributed to the band bending in the i-layer region. Also, we quantitatively simulated the changes in the Fermi level in the i-layer region depending on d with various concentrations of impurities in the i-layer region.
著作権等: © 2018 Author(s). Published by AIP Publishing.
The full-text file will be made open to the public on 13 March 2019 in accordance with publisher's 'Terms and Conditions for Self-Archiving'.
URI: http://hdl.handle.net/2433/279885
DOI(出版社版): 10.1063/1.5010956
出現コレクション:学術雑誌掲載論文等

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