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タイトル: High-resolution Li depth profiling in a thin-film all-solid-state battery using TOF-ERDA
著者: Majima, T.
Ogura, Y.
Hasegawa, C.
Nakamizo, S.
Tsuchiya, B.
Amezawa, K.
Iriyama, Y.
Yasuda, K.
著者名の別形: 間嶋, 拓也
小倉, 弓枝
中溝, 珠里
キーワード: Lithium-ion batteries
Heavy-ion elastic recoil detection analysis
Materials analysis
Ion beam analysis
Thin films
Solid-state batteries
Interfacial properties
Depth profiling techniques
Heavy ion beams
発行日: 15-Jul-2024
出版者: AIP Publishing
誌名: Applied Physics Letters
巻: 125
号: 3
論文番号: 033902
抄録: A quantitative understanding of the Li distribution inside all-solid-state Li-ion batteries is important for improving the performance of batteries. We constructed a time-of-flight (TOF) elastic recoil detection analysis (ERDA) system for operando measurements of thin-film Li-ion batteries. The TOF-ERDA measurement provides elementally resolved spectra with a depth resolution much higher than that of conventional stopper-foil ERDA. The Li depth profiles in a cathode film and solid electrolyte were obtained quantitatively to a depth of 100 nm using a 9-MeV Cu ion beam with reflection geometry. In this study, we conducted TOF-ERDA for a thin-film battery having a cathode made from LiCoO₂, an oxide-based solid electrolyte [lithium aluminum titanium phosphate (LATP)], and an anode made from Fe₂(MoO₄)₃ to demonstrate the ability of the measurement system and reveal the Li distribution near the interface with improved resolution. The depth resolution at the interface (30 nm from the surface) was estimated to be 12–14 nm. We quantitatively obtained the Li density in the LiCoO₂ cathode and the variation in the Li distribution around the LiCoO₂/LATP interface and inside the LATP electrolyte upon charging/discharging. TOF-ERDA is thus a powerful tool for the high-resolution quantitative depth analysis of Li in thin-film batteries in operando.
著作権等: This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (T. Majima, Y. Ogura, C. Hasegawa, S. Nakamizo, B. Tsuchiya, K. Amezawa, Y. Iriyama, K. Yasuda; High-resolution Li depth profiling in a thin-film all-solid-state battery using TOF-ERDA. Appl. Phys. Lett. 15 July 2024; 125 (3): 033902.) and may be found at https://doi.org/10.1063/5.0210929
The full-text file will be made open to the public on July 15 2025 in accordance with publisher's 'Terms and Conditions for Self-Archiving'.
URI: http://hdl.handle.net/2433/290944
DOI(出版社版): 10.1063/5.0210929
出現コレクション:学術雑誌掲載論文等

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