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Title: Electron microscopy and diffraction of radiation-sensitive nanostructured materials
Authors: Schaper, AK
Yoshioka, T
Ogawa, T  kyouindb  KAKEN_id
Tsuji, M
Keywords: cryo-protection
electron microscopy and diffraction
low-dose microscopy
nanocomposites
organic nanotubes and nanowires
Issue Date: 2006
Publisher: BLACKWELL PUBLISHING
Journal title: JOURNAL OF MICROSCOPY-OXFORD
Volume: 223
Start page: 88
End page: 95
URI: http://hdl.handle.net/2433/35503
Link: Web of Science
Appears in Collections:Graduate School of Engineering Literature Database

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