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| ファイル | 記述 | サイズ | フォーマット | |
|---|---|---|---|---|
| JApplPhys_100_094302.pdf | 100.66 kB | Adobe PDF | 見る/開く |
| タイトル: | Electrical breakdown of short multiwalled carbon nanotubes |
| 著者: | Tsutsui, Makusu Taninouchi, Yu-ki Kurokawa, Shu    https://orcid.org/0000-0003-3934-1040 (unconfirmed)Sakai, Akira |
| 発行日: | 1-Nov-2006 |
| 出版者: | American Institute of Physics |
| 誌名: | JOURNAL OF APPLIED PHYSICS |
| 巻: | 100 |
| 号: | 9 |
| 論文番号: | 094302 |
| 抄録: | Electrical breakdown of short (∼50nm) multiwalled carbon nanotubes(MWNTs) is studied utilizing mechanically controllable break junction technique with goldelectrodes. Measurements of the conductance-biascharacteristics near the breakdown point revealed two different types of breakdown behavior for the short MWNTs. In one type designated as type I, the conductance increases nearly linearly with the bias and, over the breakdown point, decreases stepwise. On the other hand, in the type-II breakdown, the conductance shows a transient and irreversible increase right before the breakdown and subsequently jumps to zero. We consider that the type-II breakdown in vacuum is contact related, whereas the type-I breakdown occurs through the usual MWNT heating |
| 著作権等: | Copyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |
| URI: | http://hdl.handle.net/2433/39721 |
| DOI(出版社版): | 10.1063/1.2364048 |
| 出現コレクション: | 学術雑誌掲載論文等 |
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