このアイテムのアクセス数: 298
このアイテムのファイル:
ファイル | 記述 | サイズ | フォーマット | |
---|---|---|---|---|
RevSciInstrum_71_1160.pdf | 49.59 kB | Adobe PDF | 見る/開く |
タイトル: | Compact microwave ion source for extremely low energy ion irradiation system |
著者: | Gotoh, Y ![]() ![]() Kubo, H Tsuji, H ![]() Ishikawa, J |
発行日: | Feb-2000 |
出版者: | American Institute of Physics |
誌名: | REVIEW OF SCIENTIFIC INSTRUMENTS |
巻: | 71 |
号: | 2 |
開始ページ: | 1160 |
終了ページ: | 1162 |
抄録: | The performance of a compact microwaveion source developed for extremely low energy ion extraction was measured. The ion source was modified to be fitted for the ion extraction at the voltage lower than 100 V. The current–voltage characteristics, mass spectrum, absolute ion energy, and energy spread of argon ion beam were estimated with a sector magnet. The results showed that the mass spectrum showed a clear separation of singly charged ions and doubly charged ions even at the extraction voltage of 4 V. Mass separated Ar[+] current of 0.5 nA at 4 V extraction was obtained. An excess ion energy due to presence of plasma potential was 14 eV at the pressure of 5×10[−3] Pa, and 66 eV at 9×10[−4] Pa. Energy spread was narrower than 12 eV, from rough estimate of the mass spectrum. These results summarize that the present ion source can be used for extremely low energy ion irradiation system. |
著作権等: | Copyright 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |
URI: | http://hdl.handle.net/2433/39803 |
DOI(出版社版): | 10.1063/1.1150415 |
出現コレクション: | 学術雑誌掲載論文等 |

このリポジトリに保管されているアイテムはすべて著作権により保護されています。