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書誌情報ファイル
A Cost-Effective Selective TMR for Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis
  IMAGAWA, Takashi; TSUTSUI, Hiroshi; OCHI, Hiroyuki; SATO, Takashi (2013-04)
  IEICE Transactions on Electronics, E96.C(4): 454-462
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Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures
  IMAGAWA, Takashi; HIROMOTO, Masayuki; OCHI, Hiroyuki; SATO, Takashi (2010-12)
  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E93-A(12): 2524-2532
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