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Title: Avalanche phenomena in 4H-SiC p-n diodes fabricated by aluminum or boron implantation
Authors: Negoro, Y
Miyamoto, N
Kimoto, T  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-6649-2090 (unconfirmed)
Matsunami, H
Keywords: avalanche breakdown
ion implantation
p-n diode
SiC
silicon carbide
Issue Date: 2002
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Journal title: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 49
Issue: 9
Start page: 1505
End page: 1510
URI: http://hdl.handle.net/2433/6284
DOI(Published Version): 10.1109/TED.2002.802637
Link: Web of Science
Appears in Collections:Graduate School of Engineering Literature Database

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