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Title: Crystal Structure Analysis of C60 Low Temperature Phase by Electron Crystallography with Cryo-TEM (STATES AND STRUCTURES-Crystal Information Analysis)
Authors: Ogawa, Tetsuya
Isoda, Seiji
Kobayashi, Takashi
Keywords: Electron crystallography
Imaging plate
Issue Date: Mar-1998
Publisher: Institute for Chemical Research, Kyoto University
Journal title: ICR annual report
Volume: 4
Start page: 6
End page: 7
Abstract: The crystal structure of C60 at liquid helium temperature was examined by electron diffraction method using an imaging plate and cryo-TEM. The R factor could be reduced to a certain amount by assuming a multi-component crystal. Disorder in the crystal might be an important factor as well as dynamical scattering effect to be considered in electron crystallography for analyzing structures of thin crystals.
Appears in Collections:Vol.4 (1997)

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