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Title: Crystal Structure Analysis of C60 Low Temperature Phase by Electron Crystallography with Cryo-TEM (STATES AND STRUCTURES-Crystal Information Analysis)
Authors: Ogawa, Tetsuya
Isoda, Seiji
Kobayashi, Takashi
Keywords: Electron crystallography
C60
Cryo-TEM
Imaging plate
Issue Date: Mar-1998
Publisher: Institute for Chemical Research, Kyoto University
Journal title: ICR annual report
Volume: 4
Start page: 6
End page: 7
Abstract: The crystal structure of C60 at liquid helium temperature was examined by electron diffraction method using an imaging plate and cryo-TEM. The R factor could be reduced to a certain amount by assuming a multi-component crystal. Disorder in the crystal might be an important factor as well as dynamical scattering effect to be considered in electron crystallography for analyzing structures of thin crystals.
URI: http://hdl.handle.net/2433/65166
Appears in Collections:Vol.4 (1997)

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