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Title: A new spectrophotometer system for measuring thermal radiation phenomena in a 0.30-11 mu m wavelength region
Authors: Wakabayashi, H  kyouindb  KAKEN_id
Makino, T
Keywords: thermal radiation
spectroscopic measurement
thermophysical property
heat transfer
interference and diffraction
real surface
surface film
surface roughness
surface diagnosis
Issue Date: 2001
Publisher: IOP PUBLISHING LTD
Journal title: MEASUREMENT SCIENCE & TECHNOLOGY
Volume: 12
Issue: 12
Start page: 2113
End page: 2120
URI: http://hdl.handle.net/2433/8153
Link: Web of Science
Appears in Collections:Graduate School of Engineering Literature Database

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