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タイトル: Development of low energy ion beam system for space charge compensation experiments
著者: Takeuchi, Mitsuaki
Gotoh, Yasuhito  kyouindb  KAKEN_id
Tsuji, Hiroshi  KAKEN_id
Ishikawa, Junzo
Sakai, Shigeki
発行日: Feb-2008
出版者: American Institute of Physics
誌名: REVIEW OF SCIENTIFIC INSTRUMENTS
巻: 79
号: 2(Part 2)
論文番号: 02B712
抄録: A low energy ion beam system for space charge compensation (SCC) experiments was developed and evaluated. This system was designed for observation of SCC of a positive ion beam with an electron beam. The system consisted of the ion source chamber and the SCC experiment chamber. The ion source chamber was equipped with the compact microwave ion source for low voltage extraction. Ion current at initial position of the analysis chamber was 84 µA at extraction voltage of 500 V, and satisfied a condition to observe the SCC effect clearly. In order to evaluate the SCC, we measured the arrival ion current by supplying thermionic electrons, which were extracted from a tungsten filament driven by ac voltage. As the electron supply, the arrival ion current increased from 40 to 68 µA at the potential of filament of +3 eV which produced the thermionic electron with extremely low energy extracted by space charge of the ion beam.
著作権等: Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
URI: http://hdl.handle.net/2433/84568
DOI(出版社版): 10.1063/1.2801549
PubMed ID: 18315203
関連リンク: http://link.aip.org/link/?RSINAK/79/02B712/1
出現コレクション:学術雑誌掲載論文等

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