このアイテムのアクセス数: 398
| タイトル: | High-bias breakdown of Au/1,4-benzenedithiol/Au junctions |
| 著者: | Teramae, Yumi Horiguchi, Kazunori Hashimoto, Shuhei Tsutsui, Makusu Kurokawa, Shu    https://orcid.org/0000-0003-3934-1040 (unconfirmed)Sakai, Akira |
| 発行日: | 25-Aug-2008 |
| 出版者: | American Institute of Physics |
| 誌名: | APPLIED PHYSICS LETTERS |
| 巻: | 93 |
| 号: | 8 |
| 論文番号: | 083121 |
| 抄録: | We have studied the high-bias breakdown of Au/1, 4-benzenedithiol (BDT)/Au junctions at room temperature. Exploiting the break junction technique, we held a Au/BDT/Au junction and ruptured it by applying a voltage ramp. The conductance first changes gradually with the bias and then abruptly increases at breakdown. We found that the breakdown voltage shows a broad distribution and takes a maximum at ~(1.2–1.5)V. The breakdown voltage is unaffected by the ambient atmosphere but tends to slightly decrease with increasing the junction conductance. We consider that the Au electrode becomes unstable at the breakdown voltage and collapses to crush the junction. |
| 著作権等: | Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |
| URI: | http://hdl.handle.net/2433/84603 |
| DOI(出版社版): | 10.1063/1.2976666 |
| 関連リンク: | http://link.aip.org/link/?APPLAB/93/083121/1 |
| 出現コレクション: | 学術雑誌掲載論文等 |
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