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Title: Midgap levels in As-grown 4H-SiC epilayers investigated by DLTS
Authors: Danno, K
Kimoto, T  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-6649-2090 (unconfirmed)
Matsunami, H
Keywords: DLTS
deep level
midgap
intrinsic defect
pn diode
Issue Date: 2005
Publisher: TRANS TECH PUBLICATIONS LTD
Journal title: SILICON CARBIDE AND RELATED MATERIALS 2004
Volume: 483
Start page: 355
End page: 358
URI: http://hdl.handle.net/2433/8734
Link: Web of Science
Appears in Collections:Graduate School of Engineering Literature Database

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