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書誌情報 | ファイル |
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Identification of chirality of enantiomorphic TaSi2 crystallites by convergent-beam electron diffraction Sakamoto, H; Fujii, A; Inui, H; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003) THERMEC'2003, PTS 1-5, 426-4: 1783-1788 | |
Defect structures in cosputtered thin films of transition-metal disilicides with C11(b), C40 and C54 structures Inui, H; Hashimoto, T; Fujii, A; Sakamoto, H; Okamoto, NL; Tanaka, K; Yamaguchi, M (2004) METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 35A(8): 2229-2238 | |
Defect structures in TaSi2 thin films produced by co-sputtering Inui, H; Fujii, A; Hashimoto, T; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003) ACTA MATERIALIA, 51(8): 2285-2296 | |
Enantiomorph identification of crystals belonging to the point groups of 622 and 6 by convergent-beam electron diffraction method Fujii, A; Sakamoto, H; Fujio, S; Tanaka, K; Inui, H (2007) INTERMETALLICS, 15(2): 154-167 | |
New electron diffraction method to identify the chirality of enantiomorphic crystals Inui, H; Fujii, A; Tanaka, K; Sakamoto, H; Ishizuka, K (2003) ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 59: 802-810 | |
Enantiomorph identification of transition-metal disilicides with the C40 structure (the space group of P6(2)22 and P6(4)22) by new convergent-beam electron diffraction method Sakamoto, H; Fujii, A; Tanaka, K; Inui, H (2005) ACTA MATERIALIA, 53(1): 41-52 |