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書誌情報ファイル
Identification of chirality of enantiomorphic TaSi2 crystallites by convergent-beam electron diffraction
  Sakamoto, H; Fujii, A; Inui, H; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003)
  THERMEC'2003, PTS 1-5, 426-4: 1783-1788
Defect structures in cosputtered thin films of transition-metal disilicides with C11(b), C40 and C54 structures
  Inui, H; Hashimoto, T; Fujii, A; Sakamoto, H; Okamoto, NL; Tanaka, K; Yamaguchi, M (2004)
  METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 35A(8): 2229-2238
Defect structures in TaSi2 thin films produced by co-sputtering
  Inui, H; Fujii, A; Hashimoto, T; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003)
  ACTA MATERIALIA, 51(8): 2285-2296