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書誌情報ファイル
Structural and electronic characterization of (2,3(3)) bar-shaped stacking fault in 4H-SiC epitaxial layers
  Camarda, Massimo; Canino, Andrea; La Magna, Antonino; La Via, Francesco; Feng, G.; Kimoto, T.; Aoki, M.; Kawanowa, H. (2011-02)
  APPLIED PHYSICS LETTERS, 98(5)
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Formation of a semi-insulating layer in n-type 4H-SiC by electron irradiation
  Kaneko, Hiromi; Kimoto, Tsunenobu (2011-06-27)
  APPLIED PHYSICS LETTERS, 98(26)
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Major deep levels with the same microstructures observed in n-type 4H-SiC and 6H-SiC
  Sasaki, S.; Kawahara, K.; Feng, G.; Alfieri, G.; Kimoto, T. (2011-01-01)
  JOURNAL OF APPLIED PHYSICS, 109(1)
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Temperature and injection level dependencies and impact of thermal oxidation on carrier lifetimes in p-type and n-type 4H-SiC epilayers
  Hayashi, T.; Asano, K.; Suda, J.; Kimoto, T. (2011-01-01)
  JOURNAL OF APPLIED PHYSICS, 109(1)
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Impacts of reduction of deep levels and surface passivation on carrier lifetimes in p-type 4H-SiC epilayers
  Hayashi, T.; Asano, K.; Suda, J.; Kimoto, T. (2011-06-01)
  JOURNAL OF APPLIED PHYSICS, 109(11)
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Nonradiative recombination at threading dislocations in 4H-SiC epilayers studied by micro-photoluminescence mapping
  Feng, Gan; Suda, Jun; Kimoto, Tsunenobu (2011-08-01)
  JOURNAL OF APPLIED PHYSICS, 110(3)
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Impact of nonpolar AlGaN quantum wells on deep ultraviolet laser diodes
  Kojima, K.; Yamaguchi, A. A.; Funato, M.; Kawakami, Y.; Noda, S. (2011-08-15)
  JOURNAL OF APPLIED PHYSICS, 110(4)
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Photoluminescence, morphology, and structure of hydrothermal ZnO implanted at room temperature with 60 keV Sn+ ions
  Dang, Giang T.; Kawaharamura, Toshiyuki; Nitta, Noriko; Hirao, Takashi; Yoshiie, Toshimasa; Taniwaki, Masafumi (2011-06)
  JOURNAL OF APPLIED PHYSICS, 109(12)
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Extremely high internal quantum efficiencies from AlGaN/AlN quantum wells emitting in the deep ultraviolet spectral region
  Banal, Ryan G.; Funato, Mitsuru; Kawakami, Yoichi (2011-07)
  Applied Physics Letters, 99(1)
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Optical properties of InGaN/GaN nanopillars fabricated by postgrowth chemically assisted ion beam etching
  Kawakami, Y.; Kaneta, A.; Su, L.; Zhu, Y.; Okamoto, K.; Funato, M.; Kikuchi, A.; Kishino, K. (2010)
  JOURNAL OF APPLIED PHYSICS, 107(2)