ダウンロード数: 753

このアイテムのファイル:
ファイル 記述 サイズフォーマット 
transfun.E95.A.2242.pdf837.67 kBAdobe PDF見る/開く
タイトル: A Variability-Aware Energy-Minimization Strategy for Subthreshold Circuits
著者: KAWASHIMA, Junya
TSUTSUI, Hiroshi
OCHI, Hiroyuki
SATO, Takashi  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-1577-8259 (unconfirmed)
著者名の別形: 川島, 潤也
佐藤, 高史
キーワード: subthreshold operation
process variation
minimum operation voltage estimation
energy minimization
yield maximization
発行日: Dec-2012
出版者: Institute of Electronics, Information and Communication Engineers
誌名: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
巻: E95.A
号: 12
開始ページ: 2242
終了ページ: 2250
抄録: We investigate a design strategy for subthreshold circuits focusing on energy-consumption minimization and yield maximization under process variations. The design strategy is based on the following findings related to the operation of low-power CMOS circuits: (1) The minimum operation voltage (VDDmin) of a circuit is dominated by flip-flops (FFs), and VDDmin of an FF can be improved by upsizing a few key transistors, (2) VDDmin of an FF is stochastically modeled by a log-normal distribution, (3) VDDmin of a large circuit can be efficiently estimated by using the above model, which eliminates extensive Monte Carlo simulations, and (4) improving VDDmin may substantially contribute to decreasing energy consumption. The effectiveness of the proposed design strategy has been verified through circuit simulations on various circuits, which clearly show the design tradeoff between voltage scaling and transistor sizing.
著作権等: © 2012 The Institute of Electronics, Information and Communication Engineers
URI: http://hdl.handle.net/2433/174335
DOI(出版社版): 10.1587/transfun.E95.A.2242
出現コレクション:学術雑誌掲載論文等

アイテムの詳細レコードを表示する

Export to RefWorks


出力フォーマット 


このリポジトリに保管されているアイテムはすべて著作権により保護されています。