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タイトル: | Spatial density profile of electrons near the LaAlO[3]/SrTiO[3] heterointerface revealed by time-resolved photoluminescence spectroscopy |
著者: | Yamada, Yasuhiro Sato, Hiroki K. Hikita, Yasuyuki Hwang, Harold Y. Kanemitsu, Yoshihiko https://orcid.org/0000-0002-0788-131X (unconfirmed) |
著者名の別形: | 金光, 義彦 |
発行日: | 14-Apr-2014 |
出版者: | AIP Publishing |
誌名: | Applied Physics Letters |
巻: | 104 |
号: | 15 |
論文番号: | 151907 |
抄録: | The depth profile of the electron density near the LaAlO[3]/SrTiO[3] heterointerface has been studied by means of time-resolved photoluminescence (PL) spectroscopy. A broad blue PL band is observed at 2.9 eV, originating from the two-carrier radiative recombination of interface-induced electrons andphotoexcited holes. The PL lifetime of LaAlO[3]/SrTiO[3] heterointerface is dominated by the three-carrier Auger recombination of electrons and holes and is sensitive to electron density. We tuned the probing depth by changing the excitation photon energy and evaluated the carrier-density profile using the relation between the carrier density and the PL lifetime. Our non-contact probe method based on PL spectroscopy indicates that the carriers are confined within several nanometers in depth near the LaAlO[3]/SrTiO[3] heterostructures. |
著作権等: | © 2014 AIP Publishing LLC. |
URI: | http://hdl.handle.net/2433/185716 |
DOI(出版社版): | 10.1063/1.4872171 |
出現コレクション: | 学術雑誌掲載論文等 |
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